Publications

G. Willeke

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Synchrotron-based spectrally-resolved X-ray beam induced current: a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon

T. Buonassisi, A.A. Istratov, M.D. Pickett, M.A. Marcus, G. Hahn, S. Riepe, J. Isenberg, W. Warta, G. Willeke, T.F. Ciszek, and E.R. Weber