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Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
V. Ganapati, S. Schoenfelder, S. Castellanos, S. Oener, R. Koepge, A. Sampson, M.A. Marcus, B. Lai, H. Morhenn, G. Hahn, J. Bagdahn, and T. BuonassisiJournal of Applied Physics 108, 063528 (2010)