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X-ray beam induced current – a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon
O.F. Vyvenko, T. Buonassisi, A.A. Istratov, H. Hieslmair, A.C. Thompson, R. Schindler, and E.R. WeberJournal of Applied Physics 91, Journal of Applied Physics (2001)