Publications

Exceeding 3 ms minority carrier lifetime in n-type non-contact crucible silicon

S. Castellanos, M.M. Kivambe, M.A. Jensen, D.M. Powell, K. Nakajima, K. Morishita, R. Murai, and T. Buonassisi
Energy Procedia 92, 779–784 (2016)

Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging

J. Schön, A. Youssef, S. Park, L.E. Mundt, T. Niewelt, S. Mack, K. Nakajima, K. Morishita, R. Murai, M.A. Jensen, T. Buonassisi, and M.C. Schubert
Journal of Applied Physics 120, 105703 (2016)

Shape and quality of Si single bulk crystals grown inside Si melts using the noncontact crucible method

K. Nakajima, R. Murai, S. Ono, K. Morishita, M.M. Kivambe, D.M. Powell, and T. Buonassisi
Japanese Journal of Applied Physics 54, 015504 (2015)