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Microscopic distributions of defect luminescence from subgrain boundaries in multicrystalline silicon wafers
H.T. Nguyen, M.A. Jensen, L. Li, C. Samundsett, H.C. Sio, B. Lai, T. Buonassisi, and D. MacdonaldIEEE Journal of Photovoltaics 7, 772–780 (2017)