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Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur
J.T. Sullivan, R.G. Wilks, M.T. Winkler, L. Weinhardt, D. Recht, A.J. Said, B.K. Newman, Y. Zhang, S. Krause, W.L. Yang, C. Heske, M.J. Aziz, M. Blum, M. Bär, and T. BuonassisiApplied Physics Letters 99, 142102 (2011)