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Using Atom-Probe Tomography to Understand ZnO∶Al/SiO2/Si Schottky Diodes
R. Jaramillo, A. Youssef, A.J. Akey, F. Schoofs, S. Ramanathan, and T. BuonassisiPhysical Review Applied 6, 034016 (2016)
Supporting online material available: ftp://ftp.aip.org/epaps/appl_phys_lett/E-APPLAB-106-056520