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S. Mack

1

Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging

J. Schön, A. Youssef, S. Park, L.E. Mundt, T. Niewelt, S. Mack, K. Nakajima, K. Morishita, R. Murai, M.A. Jensen, T. Buonassisi, and M.C. Schubert
Journal of Applied Physics 120, 105703 (2016)
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