1
Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging
J. Schön, A. Youssef, S. Park, L.E. Mundt, T. Niewelt, S. Mack, K. Nakajima, K. Morishita, R. Murai, M.A. Jensen, T. Buonassisi, and M.C. SchubertJournal of Applied Physics 120, 105703 (2016)