Publications

Engineering solutions and root-cause analysis for light-induced degradation in p-type multicrystalline silicon PERC modules

K. Nakayashiki, J. Hofstetter, A.E. Morishige, T.-T.A. Li, D. Berney Needleman, M.A. Jensen, and T. Buonassisi
IEEE Journal of Photovoltaics DOI: 10.1109/JPHOTOV.2016.2556981 (2016)