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Seeding of silicon wire growth by out-diffused metal precipitates
V. Ganapati, D.P. Fenning, M.I. Bertoni, C.E. Kendrick, A.E. Fecych, J.M. Redwing, and T. BuonassisiSmall 7, 563–567 (2011)
Publications
V. Ganapati
Small 7, 563–567 (2011)
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Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
V. Ganapati, S. Schoenfelder, S. Castellanos, S. Oener, R. Koepge, A. Sampson, M.A. Marcus, B. Lai, H. Morhenn, G. Hahn, J. Bagdahn, and T. BuonassisiJournal of Applied Physics 108, 063528 (2010)
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Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
V. Ganapati, S. Schoenfelder, S. Castellanos, S. Oener, and T. BuonassisiProc. 35th IEEE Photovoltaic Specialists Conference, Honolulu, HI (2010)
See also: Journal Article
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Quantitative stress measurements of bulk microdefects in multicrystalline silicon
S. Schoenfelder, A. Sampson, V. Ganapati, R. Koepge, S. Castellanos, S. Oener, and T. BuonassisiProc. 24th European Photovoltaic Solar Energy Conference, Hamburg, Germany; pp.977-980. (2009)