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Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects
A. Polizzotti, A. Faghaninia, J.R. Poindexter, L. Nienhaus, V. Steinmann, R.L.Z. Hoye, A. Felten, A. Deyine, N.M. Mangan, J.-P. Correa-Baena, S.S. Shin, S. Jaffer, M.G. Bawendi, C. Lo, and T. BuonassisiThe Journal of Physical Chemistry Letters 8, 3661–3667 (2017)