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Application of synchrotron radiation based x-ray microprobe techniques for the analysis of recombination activity of metals precipitated at Si/SiGe misfit dislocations
O.F. Vyvenko, T. Buonassisi, A.A. Istratov, E.R. Weber, M. Kittler, and W. SeifertJournal of Physics: Condensed Matter 14, 13079-13086 (2002)